M Precision Laboratories EMCPro PLUS EMC Test System

IEC 61000-4-11 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This standard applies to electrical and electronic equipment having a rated input current not exceeding 16 A per phase, for connection to 50 Hz or 60 Hz AC networks. IEC 61000-4-11 does not apply to electrical and electronic equipment for connection to 400 Hz A.C. networks. Tests for these networks will be covered by future IEC standards. The object of IEC 61000-4-11 is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions, and voltage variations.   Recommended Bundle For PQF Dips and Interrupts Tests: Haefely AXOS 5 Transient Generator   +   Haefely DIP 116 Automatic Dip Transformer   =   IEC 61000-4-11 Dips & Interrupts up to 5kV Learn More This second edition cancels and replaces the first edition published in 1994 and its amendment 1 (2000). This second edition constitutes a technical revision in which:   Preferred test values and durations have been added for the different environment classes; The tests for the three-phase systems have been specified. It has the status of a Basic EMC Publication in accordance with IEC Guide 107.   Dips and Interrupts Background Dips and interrupts can occur on the AC power mains as a result of a fault in the distribution system such as an open circuit breaker or a sudden large load being turned on in the immediate vicinity. A power distribution system fault can cause a switch in the distribution grid to open and close several times, resulting in multiple interrupts to electrical and electronic equipment. Electronic products are

This standard describes a procedure for subjecting a broadband device to surge conditions as specified in IEEE C62.411. Ports shall be tested in compliance with IEEE C62.41 Category B3 Combination Waveform or IEEE C62.41 Category A3 Ring Waveform as specified for the Device Under Test. Download MIL-STD-461   Equipment Pulse Generator The surge generator must be capable of producing the Ring Wave as specified by C62.41 Category A3 and the Combination Wave as specified by C62.41 Category B3. (one of the following or equivalent).   Coupling Filter This device is used to isolate the AC power to the device being subjected to the surge. This allows all the surge energy to be directed to the DUT and not absorbed by the power system.   Digital Sampling Oscilloscope This device is normally connected to the test connectors of the surge generator to monitor device performance.   Alternate Waveform Monitoring Equipment Test probes can be used to directly monitor the surge waveforms applied to the DUT.   Power Supply: AC or DC, as required by the DUT