Teseq NSG 3040-SOW Slow Oscillating Waveform Generator

The standard has two types of design tests for relays and relay systems that relate to the immunity of this equipment to repetitive electrical transients.  IEEE C37.90.1 covers test generator characteristics, test waveforms, selection of equipment terminals on which tests are to be conducted, test procedures, criteria for acceptance and the documentation of test results. The tests are to be applied to any part of the relay system that can be exposed to conducted or coupled transients under normal installed operating conditions.   This standard establishes a common and reproducible basis for evaluating the performance of relays and relay systems when subjected to repetitive transients on supply, signal, control, and communication lines or connections. This standard establishes that an evaluation is performed during both normal (non-tripped) and abnormal (tripped) relay operating conditions.   Retrieved from standardsforum 10-31-2013