IEC 61000-4-34: Testing and Measurement Techniques - Voltage Dips, Short Interruptions...
IEC 61000-4-34 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations.
This standard applies to electrical and electronic equipment having a rated input current exceeding 16 A per phase, for connection to 50 Hz or 60 Hz A.C. networks.
It does not apply to electrical and electronic equipment for connection to 400 Hz A.C. networks. Tests for these networks will be covered by future IEC standards.
The object of this standard is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations.
This second edition cancels and replaces the first edition published in 1994 and its amendment 1 (2000). This second edition constitutes a technical revision in which:
Preferred test values and durations have been added for the different environment classes.
Tests for the three-phase systems have been specified.
It has the status of a Basic EMC Publication in accordance with IEC Guide 107.
Dips and Interrupts Background
Dips and interrupts can occur on AC power mains as a result of a fault in the distribution system such as an open circuit breaker or a sudden large load being turned on in the immediate vicinity. A power distribution system fault can cause a switch in the distribution grid to open and close a number of times, resulting in multiple interrupts to electrical and electronic equipment.
Electronic products are tested for immunity to dips and interrupts to insure their continued reliable operation if subjected to dips and/or interrupts on the AC power mains. The European Union’s EMC Directive mandates dips and interrupts testing for virtually all electrical and electronic products as a condition for obtaining the CE Mark before shipping products to member states of