ANSI/IEEE
ANSI C62.45: Guide On Surge Testing For Equipment Connected To Low-Voltage AC Power Circuits
Standard Overview
ANSI C62.45 lists procedures for the performance of surge testing on electrical and electronic equipment connected to low-voltage AC power circuits, specifically using the recommended test waveforms defined in IEEE Std C62.41.2-2002. Nevertheless, these recommendations apply to any surge testing, regardless of the specific surges that may be applied. ANSI C62.45, the third document in a Trilogy of three IEEE standards addressing surges in low voltage ac power circuits, focuses on test procedures, using representative surge waveforms developed based on the two other documents of the Trilogy. There are no specific models that are representative of all surge environments; the complexities of the real world need to be simplified to produce a manageable set of standard surge tests. To this end, a surge environment classification scheme is presented in IEEE Std C62.41.2-2002.
Table 1: Summary of applicable standard and additional surge testing waveforms for Location Categories A, B, and C (Scenario I only) and for Scenario II
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Table 1: Summary of applicable standard and additional surge testing waveforms for Location Categories A, B, and C (Scenario I only) and for Scenario II
Scenario I Surges impringing upon the structure from the outside and generated within |
Scenario II Direct lightning flash |
||||||
Location Category | 100 kHz Ring Wave | Combination Wave | Separate Voltage/Current | 5/50 ns EFT Burst | 10/1000 μs
Wave
|
Inductive Coupling | Direct Coupling |
A | Standard | Standard | — | Additional | Additional | Category B Ring Wave | Case-by-case assesment |
B | Standard | Standard | — | Additional | Additional | ||
C Low | Optional | Standard | — | Optional | Additional | ||
C High | Optional | — | Standard | Optional | — |
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Products Used in Testing
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- IEC 61000-4-4 | Burst testing, 5.5kV
- IEC 61000-4-5 | Surge testing, 5.0kV
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In 2019 the IEEE updated the exposure reference levels (ERL), previously called maximum permissible expose (MPE). The ERL for unrestricted tier (lower tier) remain the same as in IEEE Std C95.1:2005. But the upper tier whole-body exposure ERLs above 300 MHz are different from those in IEEE Std C95.1:2005 to maintain a consistent 5× factor between tiers and to harmonize with ICNIRP guidelines.
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Narda Safety Test Solutions has a full line of “Shaped Response” instruments which complies with the IEEE C95.1:2019 exposure reference levels (ERL).
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