AC Hipot |
Output voltage |
10 - 5000V
50 or 60 Hz |
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Accuracy: 1% of setting +5 V, No load to full load |
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Resolution: 1V at all levels |
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Max load current: 20 mArms |
Leakage current |
Min/max limits during dwell of none or up to 20 mArms |
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Accuracy: 1% of reading +5 uA |
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Resolution: 1 uA |
DC Hipot |
Output voltage |
20 - 5000V test voltage |
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Accuracy: 1% of setting +5 V Full Scale, No load to full load |
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Resolution: 1V at all levels |
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Max load current: 10 mA |
Leakage current |
Accuracy: 1% +1 uA |
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Resolution: 0.1 uA |
IR - Insulation Resistance |
Test voltage |
20 - 5000 VDC |
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Accuracy: 2.5% +5V No load to full load |
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Resolution: 1V at all levels |
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Max charge current: 5 mA automatic |
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Max capacitive Load: 2 uF |
Resistance |
Max IR: 450 Gigohm (90 MΩ per volt) |
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Min IR: 150 KΩ |
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Accuracy: 2% (rdg <5% of max IR), 5% (<15% of max IR), 10% (<30% of max IR), 20% (above 30% of max IR) |
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Max resolution: 0.1% of value |
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Min/max limits: defined for each step, max may be set to none |
Test completion |
Stop on time: determination on final reading |
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Stop on pass: test terminates with PASS for any reading within limits |
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Stop on fail: test terminates with FAIL for any reading outside limits |
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Stop on steady: test terminates with PASS for any reading within limits which is |
Low Resistance |
Resistance |
Range: 0 ohm - 60 Kohm |
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Accuracy: 1.5 %+0.015 Ω (<13 Ω), 3% +1 ohm (<1KΩ), 5% (<13 KΩ)
Resolution: down to 0.001Ω
Min test time: 60 mS |
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Min/max limits: defined for each step, each may be set to none |
Test method |
2 terminal measurement, 10.5mA max, 4.15V max |
Resistance offset |
Test leads/fixture measurement offset may be universally applied |
Ground Bond |
Test current |
1 - 30 Arms (42A pk), 50/60Hz |
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Accuracy: 2.5% +10 mA |
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Resolution: settable to 0.01A at all levels |
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Compliance: >4.5 Vrms (6V pk) for all currents |
Method |
4 terminal measurement |
Resistance |
Max resistance: up to compliance V limit at defined test current (4.5 ohms max) |
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Min/max limits: defined for each step, min may be set to none |
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Accuracy: 2.5% +3 mΩ (<2 A), 2 mΩ (<6.5 A), 1 mΩ (otherwise)
Resolution: 0.1 mΩ (>6.5 A), 1 mΩ (otherwise) |
Resistance offset |
Test leads/fixture measurement offset may be universally applied |
Test Timing |
Ramp time |
For AC/DC hipot: 0 to 99.9sec (0.1sec resolution, 0.05sec accuracy) |
Test/dwell |
Time 0.1 to 9999sec or user end (0.1sec resolution, 0.15sec accuracy) |
Ramp down |
May be set to 0sec or same as Ramp time, automatically skipped if no failure and next step is same AC/DC or IR test type |
Shutdown |
Breakdown: within 150 us |
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HV safety: within 1 ms |
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User stop or interlock opened : within 2 ms |
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Resistance/current limit : within 100 ms |