Hioki IM3570 Impedance Analyzer

The Hioki IM3570 Impedance Analyzer is a single device solution for high speed testing and frequency sweeping. Hioki IM3570 impedance analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. The Hioki IM3570 is ideal for use in applications requiring low-ESR measurement on the order of several milliohms, for example testing of functional polymer capacitors, due to its superior low-impedance repeatability.

The IM3570, which serves as both an LCR meter and an impedance analyzer, can generate pass/fail judgments on the resonance condition using its frequency sweep measurement and peak comparator functions, and also conduct continuous inspections under different conditions including pass/fail decisions via 1 kHz and 120 Hz LCR testing. In this way, it is possible to make both frequency sweep measurement and LCR measurement with a single instrument.

Product Info Product Options Related Products

Measurement modes	LCR mode, Analyzer mode (Sweeps with measurement frequency and measurement level), Continuous measurement mode
Measurement parameters	Z, Y, θ, Rs (ESR), Rp, Rdc (DC resistance), X, G, B, Cs, Cp, Ls, Lp, D (tanδ), Q
Measurement range	100 mΩ to 100 MΩ, 12 ranges (All parameters are determined according to Z)
Display range	Z, Y, Rs, Rp, Rdc, X, G, B, Ls, Lp, Cs, Cp: ±(0.000000 [unit] to 9.999999G [unit], Absolute value display for Z and Y only &tdeta; : ±(0.000° to 180.000°), D : ±(0.000000 to 9.999999) Q : ±(0.00 to 99999.99), Δ % : ±(0.0000% to 999.9999%)
Basic accuracy	Z ±0.08% rdg. &tdeta;: ±0.05°
Measurement frequency	4 Hz to 5 MHz (5 digits setting resolution, minimum resolution 10 mHz)
Measurement signal level	Normal mode: V mode/CV mode: 5 mV to 5 Vrms (up to 1 MHz) 10 mV to 1 Vrms (1.0001 MHz to 5 MHz), 1 mVrms steps CC mode: 10 μA to 50 mArms (up to 1 MHz) 10 μA to 10 mArms (1.0001 MHz to 5 MHz), 10 μArms steps Low impedance high accuracy mode: V mode/CV mode: 5 mV to 1 Vrms (up to 100 kHz), 1 mVrms steps CC mode:10 μA to 100 mArms (100 mΩ and 1Ω ranges of up to 100 kHz), 10 μArms steps
Output impedance	Normal mode: 100 Ω, Low impedance high accuracy mode: 10 Ω
Display	5.7-inch color TFT, display can be set to ON/OFF
Measurement time	0.5 ms (100 kHz, FAST, display OFF, representative value)
Functions	DC bias measurement, Comparator, BIN measurement (classification), Panel loading/saving, Memory function
Interfaces	EXT I/O (handler), RS-232C, GP-IB, USB communication, USB memory, LAN
Power supply	90 to 264 V AC, 50/60 Hz, 150 VA max.
Dimensions and mass	330 mm (12.99 in) W × 119 mm (4.69 in) H × 307 mm (12.09 in) D, 5.8 kg (204.6 oz)
Accessories	Power cord × 1, Instruction manual × 1, PC communication instruction manual (CD-R) × 1

LCR measurement, DCR measurement, sweep measurement, continuous measurement and high-speed testing achieved with one instrument
High-speed testing, achieving maximum speeds of 1.5ms (1 kHz) and 0.5ms (100kHz) in LCR mode
High-accuracy measurements, basic accuracy of Z parameter: ± 0.08%
Perfect impedance analyzer for testing the resonance characteristics of piezoelectric elements, C-D and low ESR measurement of functional polymer capacitors, DCR and L-Q measurement of inductors (coils and transformers)
Perform frequency sweeps, level sweeps, and time interval measurements in analyzer mode

SKU: HIOK-IM3570

Product Options

SMD TEST FIXTURE IM9100
- Direct connection type
- SMDs with electrodes on the bottom
- DC to 8MHz
- Measurable sample sizes: 01005 to 0402 (EIA)
4-TERMINAL PROBE 9140-10
- Cable length 1 m (3.28 ft)
- DC to 200 kHz
- Impedance characteristics of 50 Ω
- 4-terminal pair configuration
- Measurable conductor diameter: ø0.3 (0.01 in) to 5 mm (0.20 in)
TEST FIXTURE 9261-10
- Cable length 1 m (3.28 ft)
- DC to 8 MHz
- Impedance characteristics of 50 Ω
- 4-terminal pair configuration
- Measurable conductor diameter: ø0.3 (0.01 in) to 1.5 mm (0.06 in)
TEST FIXTURE 9262
- Direct connection type
- DC to 8 MHz
- Measurable conductor diameter: ø0.3 (0.01 in) to 2 mm (0.08 in)
SMD TEST FIXTURE 9263
- Direct connection type
- DC to 8 MHz
- Test sample dimensions: 1 mm (0.04 in) to 10 mm (0.39 in)
DC BIAS VOLTAGE UNIT 9268-10
- Direct connection type
- 40 Hz to 8 MHz
- Maximum applied voltage of DC ±40 V
DC BIAS CURRENT UNIT 9269-10
- Direct connection type
- 40 Hz to 2 MHz
- Maximum applied current of DC 2 A
4-TERMINAL PROBE 9500-10
- Cable length 1 m (3.28 ft)
- DC to 200 kHz
- Impedance characteristics of 50 Ω
- Measurable conductor diameter: φ0.3 mm (0.01 in) to 2 mm (0.08 in)
SMD TEST FIXTURE 9677
- Direct connection type
- For measuring SMDs with electrodes on the side
- DC to 120 MHz, test sample dimensions: 3.5 mm ±0.5 mm (0.14 in ±0.02 in)
SMD TEST FIXTURE 9699
- Direct connection type
- For measuring SMDs with electrodes on the bottom
- DC to 120 MHz
- Test sample dimensions: 1.0 mm (0.04 in) to 4.0 mm (0.16 in) wide, max. 1.5 mm (0.06 in) high
CONTACT TIPS IM9901
- To replace the tip on the L2001, regular size, bundled with the L2001
CONTACT TIPS IM9902
- To replace the tip on the L2001, small size
4-TERMINAL PROBE L2000
- Cable length 1 m (3.28 ft)
- DC to 8 MHz
- Impedance characteristics of 50 Ω
- 4-terminal pair configuration
- Measurable conductor diameter: ø0.3 (0.01 in) to 5 mm (0.20 in)
PINCHER PROBE L2001
- DC〜8MHz
- 50Ω
- Tip electrode spacing: 0.3 (0.01 in) to 6 mm (0.24 in)
SMD TEST FIXTURE IM9110
- Direct connection two-terminal measurement type
- DC to 1 MHz
- Measurable sample sizes: 008004 (EIA)