AE Techron 3110 Standards Waveform Generator
- Includes a large library of Automotive and Aviation Standards’ test routines--complete list available as Supplemental Document under Datasheet on left
- Drag and drop interface makes it easy to modify existing tests or build new waveform sequences
- Loop entire tests or test sections; repeat loops with increments of up to four variables
AE Techron 3110A Standards Waveform Generator
- Easiest-to-use LF wave sequence generator
- 1550+ automotive and aviation standards' tests included
- Dramatically reduces test time for repetitive test sequences
AE Techron CIS-25 EMC Testing Kit
- Combines into a single, complete package the items needed to accurately test to important Aviation standards like DO-160 sections 18 and 19
- Included with the kit are three coupling transformers (T1000, T2000, and T3700)
- Includes the DSR 100-25 test system and the CR 600 Chattering Relay accessory
AE Techron DSR 100-200 | Pulse 2B and 4
- 4-Quadrant – Can source and sink current.
- ±80V – DC supply for 12V to 48V systems; meets 80V surge requirements.
- 300 kHz Sine – DC ripple tests for all major standards.
BOLAB 100-TS Series | DC – 200 kHz, 400 W – 18000 W
- DC to 200 kHz full range bandwidth
- Rise time / fall time up to 100 V/µs
- Arbitrary function with 1 Million memory data points
EM Test VDS 200N100 Voltage Drop Simulator 60 V, 100 A
- Voltage up to 60 V
- Current up to 100A
- Bipolar-amplifier models available
EM Test VDS 200N30 Voltage Drop Simulator | 60 V, 30 A
- Voltage up to 60 V
- Current up to 30A
- Bipolar-amplifier models available
EM Test UCS 200N50 Automotive Transient Generator
- Built-in EFT/burst generator module
- Built-in micropulse generator module (ISO 7637, JASO, SAE and NISSAN)
- Built-in coupling network 80 V, (up to 100 A)
Teseq AES 5501 Automotive Emissions Test System for ISO 7637-2
- The only complete, compliant solution for ISO 7637-2 emissions testing
- Clean, reliable 100 A operation with very low voltage drop
- Industry standard relay footprint for a wide selection of relays (one 100 A relay included)
BOLAB AN-ABCD-300-C10 Artificial Network System | 1000 V, 300 A
- In accordance with LV123, ISO 21498, MBN 11123, VW 80300, and IEC 61851-23
- Liquid cooled for stabile resistance temperature and constant ohmic value
- True continues current loading without derating, ideal for in-the-loop testing during the development stage of HV components
Bolab AN-ABCD-60 Artificial Network System | 1000 V, 60 A
- In accordance with LV123, ISO 21498, MBN 11123, VW 80300, and IEC 61851-23
- Liquid cooled for stable resistance temperature and constant ohmic value
- True continues current loading without derating, ideal for in-the-loop testing during the development stage of HV components
EM Test Autowave Arbitrary Generator
- Dual-Processor-Technology, 500kS/s sample rate
- 4-channel arbitrary generator
- 2-channel transient recorder
BOLAB Systems BLS-130-70N-TS 4-Quadrant Voltage Amplifier
- DC to 200 kHz full range bandwidth
- DC up to 1 MHz (small signal -3 dB)
- Option for running as a current amplifier
Hilo-Test CAR-AWG 1200 Battery Simulator
- For electrical installation of vehicles
- Battery simulator
- Bandwidth DC-200kHz
Hilo-Test CAR-AWG 6000 Battery Simulator
- Batterie simulator
- Bandwidth DC-200kHz
- Signal Bandwith DC-1MHz (small signal -3dB)
Hilo-Test CAR PG 2804 Load Dump Generator
- Load Dump Generator.
- Pulse #5 / Test A / Test B.
- Ri = 0.5 / 1 / 2 / 4 / 8 Ω
Hilo-Test CAR Test System 14
- Rise time variable 1 - 5µs.
- Vehicle voltages : 12V / 24V / 42V / 48V / 70V.
- Battery current: 50A / 100A / 200A.
Teseq CDN 500 ISO 7637-3 Capacitive Coupling Clamp
Teseq DS5630 Interrupt Simulator
EM Test ISO Automotive Rack
- All the test equipment fits
- Complete cabling of the power supply, GPIB/USB control lines
- Central reference ground plane per ISO 7637-2
Noiseken ISS-7650 Automotive Transient Surge Simulator
- Pulse 5a and Pulse 5b generating unit
- A built-in 60V/30A Coupling Network allows independent operation.
- Capacitive - resistive (inductive) discharge circuitry in strict conformity with the standard and with the actual car environment.
Teseq JT 5510 Automotive Transient Generator for JASO D001-94
- Plug-in modules for JASO D001-94
- For many classic Japanese immunity tests
- Cost-effective addition to the NSG 5500 automotive transient generator
EM Test LD 200N Load Dump Generator for ISO 7637
- Generates clipped load dump pulses (optional built-in module).
- Built-in 0.5 - 38 ohm source impedance, selectable in 0.1 ohm steps.
EM Test LD 200N100 Load Dump Generator
- Built-in 100A coupler 60 V/100 A
- Built-in battery switch for 100A
- Generates Clipped Load Dump pulses
Teseq LD 5505 Load Dump Generator
Teseq LD 5550 Load Dump Generator
EM Test LD200S19 Load Dump Generator
- Load Dump generator as per Toyota Specification
- Generates pulses Test 1, Test 2 and Test 3
- Built-in coupling network for 60V/25A DC
LV 123 Automotive Component Testing System
Teseq MT 5511 Transient Generator Module
- Numerous pulse widths, impendances, rise times included for all international standards and most manufacturer standards
- Optional Ri jack for extended Ri options
- B NC connector for new coupling methods
Schwarzbeck NNBL-8240 | 150 kHz - 100 MHz
- Complies with MIL-STD-461E standard
- 150 kHz – 100 MHz
- Ideal for military, RF, and space industries
Teseq NSG 5600 Automotive Transient Generator
Teseq NSG 5000 EMC Test System for Automotive Electronics
Teseq NSG5004A Battery Simulator
- Output voltage: 0 to ±30Vdc, stabilized via sensor connections
- Current: 12.5A/25A, short-term 3 x I for 100ms
- Impedance: 0.01Ω eff.
Teseq NSG5005A Load Dump Module
Teseq NSG 500B/11 Interference Simulator
Teseq NSG500C/NSG506C EMC Test System
- Pulse 1 Peak Voltage: -30 to -300 V Risetime: 1 / 2 / 3 / 4 µs Pulse width: 50 / 200 µs / 2 ms Repetition rate: 0.5 / 5 s Selectable Battery Off time: 200 ms Source
- Peak Voltage: -30 to -300 V
- Risetime: 1 / 2 / 3 / 4 µs
Teseq NSG5041 Surge Pulse Generator
Teseq NSG 5071 Inducitive Switch Transient Test Circuit
- Designed in accordance to Ford standard EMC-CS-2009
- Transients disturbances CI 220 A and C pulses
- CI 260 waveform F
Teseq NSG5200 Automotive Transient Test System
Teseq NSG 5500 Automotive Transient Immunity Tester for ISO 7637
Teseq PA 5740 Power Amplifier/Battery Simulator
- Capacitive stability mode
- High bandwidth up to 180 kHz
- Fast slew rate
Teseq PA 5840 Automotive Power Amplifier/Battery Simulator
- Large inrush current capability
- Capacitive stability mode
- High bandwidth up to 150 kHz
Teseq PA5640 Internal +/-15V, 5A Battery Simulator
EM Test PFM 200N100.1 Automotive Power Fail Simulator
- Switch for Power supply (100 A) and signal/data lines (2 A)
- Pulses E10 and E13 of the LV 124/LV 148 standard
- Bidirectional current direction
EM Test PFS 200N Series Automotive Power Fail Simulator
- Standalone test generator for voltage dips and interruptions
- Rise/fall time <1us
- Electronic short-circuit protection
EM Test RCB 200N1 Transient Immunity Test Generator for FORD EMC-CS-2009.1
- Approved by Ford acc. to EMC-CS-2009.1 requirements
- Pulses CI 220: A1, A2-1, A2-2, C-1 and C-2
- Pulse CI 260: F
EM Test Automotive Transient Emission Set 100 kHz - 125 MHz
- BS 200N100 - Electronic switch, 60V DC/100A: Volt.Drop <1.2V@100A, <0.2V@25A Peak voltage max. 1,000V Reverse-polarity/short-circuit protected
- Volt.Drop <1.2V@100A, <0.2V@25A
- Peak voltage max. 1,000V
EM Test UCS 200M Ultra-Compact Simulator for Automotive Transients
EM Test UCS 200N100 Automotive Transient Generator
- Built-in EFT/Burst generator module
- Built-in Micropulse generator module (ISO 7637, JASO, SAE and NISSAN)
- Built-in coupling network 60V, up to 200A
EM Test UCS 200N Automotive Transient Generator for ISO 7637
- Built-in EFT/Burst generator module
- Built-in Micropulse generator module (ISO 7637, JASO, SAE and NISSAN)
- Built-in coupling network 60V, up to 200A
EM Test VDS 200B Voltage Drop Simulator
EM Test VDS 200N Voltage Drop Simulator
- Voltage up to 60V
- Current up to 200A (peak up to 1,000A)
- Bipolar-amplifier models available