A PIND (or Particle Impact Noise Detection) tester is a non-destructive method of detecting loose particles within an electronics device cavity that may cause short circuits or other malfunctions. PIND testers operate by vibrating and mechanically shocking the testing sample to cause any loose particles within the device to move about the cavity. If loose particles are present, their impact is registered by the ultrasonic transducer of the PIND. ATEC carries PIND testers that meet and exceed the requirements of military standards for PIND testing (U.S. MIL-STD-883, 750, 202, 39016D).